DocumentCode :
2563884
Title :
Gate resistance influence on the impedance matching for common gate MOSFET amplifiers
Author :
Andriesei, C. ; Temcamani, F.
Author_Institution :
Gheorghe Asachi Tech. Univ., Iaşi, Romania
Volume :
2
fYear :
2011
fDate :
17-19 Oct. 2011
Firstpage :
391
Lastpage :
394
Abstract :
The gate and bulk resistances influence on the impedance matching in case of MOSFET common gate amplifiers is investigated. It is shown that using a supplementary resistance of maximum 100Ω, S11 becomes less than -15 dB over a wide frequency range, therefore making the circuit suitable for low power wideband RF applications and less sensitive to the loading capacitor value, at the price of a supplementary noise. The simulations were carried out in 0.35μm AMS CMOS process.
Keywords :
CMOS analogue integrated circuits; MOSFET circuits; amplifiers; impedance matching; AMS CMOS process; MOSFET common gate amplifiers; gate resistance influence; impedance matching; loading capacitor value; low power wideband RF applications; resistance 100 ohm; size 0.35 mum; supplementary noise; supplementary resistance; Impedance matching; Logic gates; Low-noise amplifiers; Noise; Noise figure; Radio frequency; Resistance; CMOS; RF; common gate amplifier; impedance matching; low noise amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2011 International
Conference_Location :
Sinaia
ISSN :
1545-827X
Print_ISBN :
978-1-61284-173-1
Type :
conf
DOI :
10.1109/SMICND.2011.6095826
Filename :
6095826
Link To Document :
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