• DocumentCode
    2564488
  • Title

    Nb/Al/sub 2/O/sub 3//Nb-Josephson voltage standards at 1 volt and 10 volt

  • Author

    Popel, R. ; Niemeyer, J. ; Fromknecht, R. ; Meier, W. ; Grimm, L.

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Braunschweig, West Germany
  • fYear
    1990
  • fDate
    11-14 June 1990
  • Firstpage
    38
  • Lastpage
    39
  • Abstract
    Series array Josephson voltage standards in Nb/Al/sub 2/O/sub 3//Nb technology producing stable reference voltages up to 12 V with step amplitudes of about 70 mu A are reported. The 1-V standard chips contain 2000 tunnel junctions, and the 10-V standard chips 20,000 junctions. The 10-v design has been optimized to reduce the total circuit area to 10 mm*27 mm and the total active tunnel junction area to only 7 mm*13 mm The incident microwave power at 70 GHz is distributed over 64 parallel stripline paths. At 10 V, the voltage steps are usually stable for 30 min. The best result achieved was 80 min. This, allows the long-term output voltage recording of a series connection of Weston cells, the direct calibration of 10-V Zener reference standards, linearity measurements of digital voltmeters, and the determination of the noise spectra of Zener references and Weston cells.<>
  • Keywords
    Josephson effect; Zener diodes; aluminium compounds; calibration; digital voltmeters; measurement standards; niobium; primary cells; reference circuits; superconducting junction devices; voltage measurement; 1 V; 10 V; 30 min; 70 GHz; 70 muA; 80 min; Josephson voltage standards; Nb-Al/sub 2/O/sub 3/-Nb; Weston cells; Zener reference standards; digital voltmeters; direct calibration; incident microwave power; linearity measurements; noise spectra; parallel stripline paths; series array; stable reference voltages; standard chips; tunnel junctions; Calibration; Design optimization; Digital recording; Linearity; Measurement standards; Microwave circuits; Niobium; Noise measurement; Stripline; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
  • Conference_Location
    Ottawa, Ontario, Canada
  • Type

    conf

  • DOI
    10.1109/CPEM.1990.110098
  • Filename
    110098