• DocumentCode
    2565003
  • Title

    High speed comparator for flash ADC and UWB application in 130 nm CMOS technology

  • Author

    Marvast, M. J Taghizadeh ; Ali, M. A Mohd

  • Author_Institution
    Dept. of Electr. Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi, Malaysia
  • fYear
    2009
  • fDate
    18-19 Nov. 2009
  • Firstpage
    402
  • Lastpage
    405
  • Abstract
    High speed comparator for high-speed flash analog-to-digital converter (ADC) and ultra wideband applications that can work at a sampling rate of 7 GS/s is presented in this paper. This fully differential comparator consists of three stages using a new structure to improve its performance. The offset voltage of the designed comparator has been reduced by means of an active positive feedback. The analyses and simulation results were obtained by using 130 nm CMOS parameters. The comparator can operate with a 1 V peak-to-peak input range consuming 371 μW. The predicted performance is verified by analyses and simulations using HSPICE tool.
  • Keywords
    CMOS memory circuits; analogue-digital conversion; comparators (circuits); flash memories; ultra wideband technology; CMOS parameters; HSPICE tool; UWB Application; analog-to-digital converter; flash ADC; high speed comparator; power 371 muW; size 130 nm; ultra wideband; voltage 1 V; CMOS technology; Circuits; Energy consumption; Feedback; Inductors; Linearity; Preamplifiers; Sampling methods; Ultra wideband technology; Voltage; Analog-to-digital converter; comparator; flash; high speed; preamplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Image Processing Applications (ICSIPA), 2009 IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-5560-7
  • Type

    conf

  • DOI
    10.1109/ICSIPA.2009.5478686
  • Filename
    5478686