Title :
Gas temperature measurement in Ar and Ar-Cl2 based ICP discharge: Comparison between experiments and simulations
Author :
Sirse, N. ; Delivré, Q. ; Booth, J.P. ; Chabert, P.
Author_Institution :
LPP, Ecole Polytech., Palaiseau, France
Abstract :
Summary form only given. Gas temperature is an important parameter for the study of discharge modeling and in plasma etching process. We present neutral gas temperatures in Ar and Ar-Cl2 based ICP discharge measured by diode laser absorption spectroscopy (IRLAS) and Laser Induced Fluorescence (LIF) of argon metastable atoms. The temperature was deduced from the Doppler width of the 1s5→2p7 transition at 772.38nm. The line averaged temperature was determined by absorption spectroscopy, whereas the local gas temperature at the reactor centre was determined from the laser-excited 1s4←2p7 fluorescence at 810nm. The gas temperature was measured as a function of power (50-500W), pressure (5-90mTorr) and %Cl2 in Ar (0-90%). In pure Ar the temperature increase with gas pressure and RF power, reaching 600K at 90mTorr 500W, whereas in 90% Cl2 temperatures as high as 1500K were found. The results were compared to simulations using the Hybrid Plasma Equipment Model (HPEM)1. The simulations indicated significantly lower temperatures than the experiment, which were furthermore independent of gas pressure (5-90mTorr) in Ar. Finally the electron density was also compared with the simulation results for same range of operating conditions.
Keywords :
argon; chlorine; discharges (electric); electron density; fluorescence; plasma density; plasma diagnostics; plasma simulation; plasma temperature; Ar; Ar-Cl2; Doppler width; ICP discharge; RF power; argon metastable atoms; diode laser absorption spectroscopy; discharge modeling; electron density; gas pressure; gas temperature measurement; hybrid plasma equipment model; laser induced fluorescence; laser-excited fluorescence; line averaged temperature; local gas temperature; neutral gas temperatures; operating conditions; plasma etching process; power 50 W to 500 W; pressure 5 mtorr to 90 mtorr; pure Ar; reactor centre; temperature 1500 K; temperature 600 K; wavelength 772.38 nm; Argon; Biological system modeling; Discharges (electric); Iterative closest point algorithm; Plasma temperature; Temperature measurement;
Conference_Titel :
Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4577-2127-4
Electronic_ISBN :
0730-9244
DOI :
10.1109/PLASMA.2012.6383920