DocumentCode
2565218
Title
Form wound stator insulation system under different voltage waveform stresses
Author
Yu, Ya Tong ; Jayaram, Shesha H.
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON, Canada
fYear
2009
fDate
May 31 2009-June 3 2009
Firstpage
425
Lastpage
429
Abstract
The paper presents the experimental results under power frequency, exponential decay pulse, square and sinusoidal pulse width modulated (SPWM) voltage waveforms, with the same peak values, applied to the insulation system of a form wound stator coil. Both the infrared images and the maximum temperature rise of the coil under different electrical stresses were recorded. Results show that the temperature rise of the coil surface under square wave or SPWM wave stress are much higher than the temperature rise observed under the stress of power frequency sinusoidal voltage or exponential decay pulses. FFT analysis shows that both the square and SPWM waveforms used in this study contain significantly higher harmonic components, similar to a real drive output voltage; hence resulted in a higher temperature rise compared to the other voltage waveforms used. Thus, neither the power frequency sinusoidal voltage nor the fast repetitive exponential decay type pulsed voltage can fully represent the transients caused by a voltage waveform of a real drive; voltage source converter.
Keywords
PWM power convertors; coils; fast Fourier transforms; machine insulation; stators; FFT analysis; electrical stresses; exponential decay pulse; fast Fourier transforms; form wound stator coil insulation system; infrared images; power frequency; sinusoidal pulse width modulated voltage waveforms; square waveform; voltage source converter; voltage waveform stresses; Coils; Frequency; Insulation; Pulse width modulation; Space vector pulse width modulation; Stators; Stress; Temperature; Voltage; Wounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation Conference, 2009. EIC 2009. IEEE
Conference_Location
Montreal, QC
Print_ISBN
978-1-4244-3915-7
Electronic_ISBN
978-1-4244-3917-1
Type
conf
DOI
10.1109/EIC.2009.5166384
Filename
5166384
Link To Document