DocumentCode :
2565379
Title :
A 5 ns 1 Mb ECL BiCMOS SRAM
Author :
Takada, Masumi ; Nakamura, Kentaro ; Takeshima, Toshiaki ; Furuta, K. ; Yamazaki, Tsutomu ; Imai, Koichi ; Ohi, Shoichi ; Fukuda, Yukikatsu ; Minato, Y. ; Kimoto, Hideaki
Author_Institution :
NEC Corp., Sagamihara, Japan
fYear :
1990
fDate :
14-16 Feb. 1990
Firstpage :
138
Lastpage :
139
Abstract :
A 1 M-word*1-b emitter-coupled-logic (ECL) SRAM in 0.8- mu m BiCMOS technology that achieves 5-ns access time using (1) wired-OR predecoders, (2) ECL CMOS level converters with partial address decoding, and (3) sensing with small differential voltage swing on long read bus lines is described. The memory cell array is divided into two 512 K-cell subarrays. Each subarray consists of 16 32-kb arrays, each of which is organized into 256 rows and 128 columns. An X-decoder is located between a pair of 32-kb arrays. Address input signals are received by an ECL address buffer. The first circuit for address decoding is a wired-OR predecoder, which does the predecoding and predecoded signal line driving. Predecoded address signals with about 1.2-V voltage swing drive 16.5-mm predecoded lines between two 512-kb subarrays and are received by partial-decoding level converters at corresponding 32-kb arrays.<>
Keywords :
BIMOS integrated circuits; SRAM chips; emitter-coupled logic; 0.8 micron; 1 Mbit; 5 ns; ECL BiCMOS SRAM; ECL CMOS level converters; ECL address buffer; X-decoder; access time; emitter-coupled-logic; memory cell array; partial address decoding; static RAM; wired-OR predecoders; BiCMOS integrated circuits; Current supplies; Decoding; Delay effects; Driver circuits; Logic circuits; MOSFETs; Mirrors; Random access memory; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1990. Digest of Technical Papers. 37th ISSCC., 1990 IEEE International
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/ISSCC.1990.110165
Filename :
110165
Link To Document :
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