DocumentCode
2565648
Title
Electrical ageing test on conventional and nanocomposite enamels: PD patterns analysis
Author
Guastavino, F. ; Coletti, G. ; Ratto, A. ; Torello, E.
Author_Institution
Electr. Eng. Dept., Univ. of Genova, Genoa, Italy
fYear
2009
fDate
May 31 2009-June 3 2009
Firstpage
537
Lastpage
541
Abstract
In this work the partial discharge (PD) patterns acquired during electrical aging tests performed on twisted pair specimens prepared by winding wires having conventional or nanostructured enamel insulation are compared. The conventional enamel is polyamide imide, while the nanostructured enamel is a polyamide-silica nanocomposite. The tests have been performed applying sinusoidal voltage at different frequencies. The outcome shows interesting features of the PD activity monitored during the tests allowing a comparison between the two different insulating systems.
Keywords
ageing; enamels; insulation; partial discharges; conventional enamels; electrical ageing test; enamel insulation; nanocomposite enamels; partial discharge patterns; Aging; Cable insulation; Dielectrics and electrical insulation; Frequency; Insulation testing; Partial discharges; Pattern analysis; Performance evaluation; Voltage; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation Conference, 2009. EIC 2009. IEEE
Conference_Location
Montreal, QC
Print_ISBN
978-1-4244-3915-7
Electronic_ISBN
978-1-4244-3917-1
Type
conf
DOI
10.1109/EIC.2009.5166404
Filename
5166404
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