DocumentCode :
2565695
Title :
Test Case Reduction Based on Program Invariant and Genetic Algorithm
Author :
Pan, Nenggang ; Zeng, Fanping ; Huang, Yu-Han
Author_Institution :
Sch. of Comput. Sci. & Technol., Univ. of Sci. & Technol. of China, Hefei, China
fYear :
2010
fDate :
23-25 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Test case reduction is the focus of the field of software testing. In this paper, we integrate random testing methods, invariant technology and genetic algorithms for test case reduction. Program invariant here refers to the properties at some points of program, it can reveal the extent of program data coverage and other valuable information. We evaluate the parent program invariants to filter corresponding set of test cases, and keep the better ones on the offspring. Generation by generation, we can get the final reduced set of test cases. This method is easy to automate. Experimental results and analysis show that compared to similar methods, at the same coverage conditions, the method proposed in this paper have higher efficiency and can get better set of test cases.
Keywords :
genetic algorithms; program testing; genetic algorithms; invariant technology; program invariant; random testing methods; software testing; test case reduction; Algorithm design and analysis; Heuristic algorithms; Optimization; Software; Software engineering; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Communications Networking and Mobile Computing (WiCOM), 2010 6th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-3708-5
Electronic_ISBN :
978-1-4244-3709-2
Type :
conf
DOI :
10.1109/WICOM.2010.5601284
Filename :
5601284
Link To Document :
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