• DocumentCode
    2566081
  • Title

    A 38 ns 4 Mb DRAM with a battery back-up (BBU) mode

  • Author

    Konishi, Yasuo ; Dosaka, Katsumi ; Komatsu, Teruhisa ; Ionue, Y. ; Kumanoya, M. ; Tobita, Y. ; Genjyo, H. ; Nagatomo, Makoto ; Yoshihara, Tatsuhiko

  • Author_Institution
    Mitsubishi Electr. Corp., Itami, Japan
  • fYear
    1990
  • fDate
    14-16 Feb. 1990
  • Firstpage
    230
  • Lastpage
    231
  • Abstract
    A 4-Mb DRAM that has 38-ns RAS (row-address-strobe) access time and a battery-backup (BBU) mode, and retains data with a 44- mu A current requirement is described. The BBU mode is a self-refresh mode. Its power dissipation, however, is reduced in comparison with that of a normal refresh operation. The memory can operate as a standard 4-Mb DRAM, without any timing constraint on CAS (column-address-strobe) and RAS, if the operating cycle does not exceed 16 ms. This approach promises more stable supply at lower cost than specially provided counterparts such as pseudo-SRAMs.<>
  • Keywords
    DRAM chips; 38 ns; 4 Mbit; 44 muA; CAS; DRAM; RAS; battery back-up; current requirement; operating cycle; power dissipation; row-address-strobe; self-refresh mode; Batteries; Bonding; CMOS process; CMOS technology; Circuits; Packaging; Random access memory; Switches; Testing; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1990. Digest of Technical Papers. 37th ISSCC., 1990 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1990.110209
  • Filename
    110209