Analysis of discontinuities created by a multilayer material in a rectangular waveguide using mode matching technique

This paper presents a new method to analyze the discontinuity of a multilayer dielectric material. The multilayer material sample is loaded in an X-band rectangular waveguide and its two port S-parameters are simulated as a function of frequency using the software Ansoft HFSS. Also, by applying the mode matching technique, expressions for the S-parameters of the multilayer dielectric material as a function of complex permittivity of individual layers are developed. A single layer material formed by using materials such as Teflon, a number of two layer materials formed by combinations of plexiglass and Teflon and sample of three layer materials are also presented.