DocumentCode
256653
Title
Fundamentals based approach to predict socket stack performance
Author
Meyyappan, K. ; McAllister, A. ; Abraham, A. ; Krithivasan, V. ; Murtagian, G.
Author_Institution
Corp. Quality Network, Intel Corp., Hillsboro, OR, USA
fYear
2014
fDate
12-15 Oct. 2014
Firstpage
1
Lastpage
7
Abstract
The field performance of a separable socket/connector is governed by its ability to maintain the target contact resistance throughout its life. Contact resistance stability and protection against field degradation mechanisms is achieved by maintaining a critical normal force on the contact. With growing socket contact pin counts and package complexities there are challenges with achieving and maintaining this critical contact normal force across the array of contacts in the socket. In this effort, the authors characterized the key mechanical and resistance relationship (Force-Deflection-Resistance)through single contact resistance measurements. An analytical model of a socket stack was developed to better capture the contact normal force distribution across the contact array. The contact forces extracted from the analytical model were then converted to contact resistances through the Force-Deflection-Resistance relationship obtained from single contact resistance measurements. Force-Resistance variation from contact to contact was comprehended through a Bootstrapping technique. This fundamental based approach of using finite element, single contact data and statistics was then validated against fully enabled socket measurements using electrically daisy chained test vehicles.
Keywords
contact resistance; electric connectors; finite element analysis; statistical analysis; bootstrapping technique; contact array; contact normal force distribution; contact resistance protection; contact resistance stability; electrically daisy chained test vehicles; field degradation mechanisms; finite element method; force-deflection-resistance relationship; force-resistance variation; separable socket-connector field performance; single contact resistance measurements; socket contact package complexity; socket contact pin counts; socket stack analytical model; socket stack performance prediction; Arrays; Contact resistance; Electrical resistance measurement; Force; Resistance; Sockets; Contact Resistance; Resistance Predictions; Socket;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts (Holm), 2014 IEEE 60th Holm Conference on
Conference_Location
New Orleans, LA
Type
conf
DOI
10.1109/HOLM.2014.7031071
Filename
7031071
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