Title :
2007 7th International Conference on ASIC
Abstract :
The following topics are dealt with: VLSI systems and circuits; analog, mixed signal and RF circuits; application-specific SoCs; testing technology and design for testability; advanced memory, MEMS and NEMS techniques; CAD techniques; and VLSI design.
Keywords :
CAD; VLSI; analogue circuits; design for testability; micromechanical devices; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; system-on-chip; CAD techniques; MEMS techniques; NEMS techniques; RF circuits; VLSI circuits; VLSI design; VLSI systems; analog circuits; application-specific SoC; design for testability; mixed signal circuits; testing technology;
Conference_Titel :
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-1131-3
DOI :
10.1109/ICASIC.2007.4415538
