DocumentCode :
2566713
Title :
Surface Defect Isolation in Ceramic Tile Based on Texture Feature Analysis Using Radon Transform and FCM
Author :
Mansoory, Meysam Siyah ; Tajik N, H. ; Pashna, Mohsen
Author_Institution :
Bio Med. Eng. Dept., Azad Univ., Tehran, Iran
fYear :
2009
fDate :
15-17 May 2009
Firstpage :
85
Lastpage :
90
Abstract :
Applying image processing technology and machine vision in industry have had significant development in recent decade. Tile and ceramic industry was not excluded form this matter. By using image processing techniques in production line of this industry, it is possible to detect surface defections such as edge defections, cracks and coloring defections. Surface defection is the most common type of defection in tile and ceramic industry. In this article a new and simple approach for detecting surface defections is introduced. The proposed algorithm has four parts. First, angle correction using Radon transform, then, background elimination using Fuzzy C-Means, after that ,analyzing feature texture , and finally, classification with neural network. The available algorithm in the article has good ability in distinguishing the healthy tile from defective one. Compared with results of other methods; the used algorithm in this article has better results on actual data base, in presence of camera noise and environmental lighting effects.
Keywords :
Radon transforms; ceramic industry; computer vision; feature extraction; fuzzy set theory; image classification; image texture; neural nets; tiles; FCM; Radon transform; camera noise; ceramic tile industry; environmental lighting effects; fuzzy C-means algorithm; image classification; image processing technology; machine vision; neural network; surface defect isolation; texture feature analysis; Ceramics industry; Image edge detection; Image processing; Image texture analysis; Isolation technology; Machine vision; Machinery production industries; Surface cracks; Surface texture; Tiles; Ceramic Tile; FCM; Neural Network; Radon Transform; Texture Feature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
2009 International Conference on Signal Processing Systems
Conference_Location :
Singapore
Print_ISBN :
978-0-7695-3654-5
Type :
conf
DOI :
10.1109/ICSPS.2009.66
Filename :
5166752
Link To Document :
بازگشت