• DocumentCode
    2566787
  • Title

    Lumped Element Circuit Model of Pulsed Power for PIC Simulation of High Power Microwave Tubes

  • Author

    Mardahl, P.J. ; Vaccaro, N.J. ; Cartwright, K.L.

  • Author_Institution
    Directed Energy Directorate, Air Force Res. Lab., Kirtland AFB, NM
  • fYear
    2005
  • fDate
    20-23 June 2005
  • Firstpage
    120
  • Lastpage
    120
  • Abstract
    Summary form only given. When simulating high power microwave tubes, tube operation can influence the pulsed power network as well as vice versa. Commonly used approximations, such as a wave emitting/absorbing boundary condition, do not capture the dynamic mutual interaction of pulsed power with the microwave tube. For example, impedance collapse due to diode closure will cause both a drop in the pulsed power input voltage and increased current draw, an effect which might be simulated incorrectly if the wave emitting boundary condition assumes the pulsed power produces a prescribed voltage. We have modified the ICEPIC code to include lumped circuit elements as described in Taflove but recast into modifications of the current on the computational mesh rather than modified electric field updates. Using these lumped elements we have created an LC circuit model of the pulsed power drive: this model produces a flat-top voltage profile across a resistive load similar to experimental results. We also compare LC-circuit driven magnetron simulations with wave-driven simulations and experiment. We also study introducing mutual inductances between stages of the pulsed power by placing inductors adjacent to each other in simulation
  • Keywords
    lumped parameter networks; magnetrons; microwave tubes; ICEPIC code; PIC simulation; diode closure; impedance collapse; lumped element circuit model; magnetron; microwave tubes; mutual inductances; pulsed power; resistive load; Circuit simulation; Computational modeling; Electromagnetic scattering; Finite difference methods; Microwave circuits; Plasma simulation; Plasma waves; Pulse circuits; Ray tracing; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-9300-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.2005.359081
  • Filename
    4198340