Title :
Bounds For BEM Capacitance Extraction
Author :
Beattie, Michael W. ; Pileggi, Lawrence T.
Author_Institution :
Carnegie Mellon University, Department of Electrical and Computer Engineering
Keywords :
Boundary element methods; Circuits; Conductors; Contracts; Data mining; Parasitic capacitance; Permission; Spatial databases; Terminology; Upper bound;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-4093-0
DOI :
10.1109/DAC.1997.597131
