DocumentCode :
2567205
Title :
Direct replacement of silicon ECL and TTL SRAMs with high performance GaAs devices
Author :
Terrell, W.C. ; Ho, C.L. ; Hinds, R.
Author_Institution :
Vitesse Semicond. Corp., Camarillo, CA, USA
fYear :
1988
fDate :
6-9 Nov. 1988
Firstpage :
79
Lastpage :
82
Abstract :
Most high-speed GaAs SRAMs (static random-access memories) previously reported require nonstandard power supplies, and/or operate in a narrow temperature range. The authors describe two 1 K (256*4) SRAMS, one with TTL (transistor-transistor logic) I/O and the other with ECL (emitter-coupled logic) I/O. These are drop-in replacements for the industry standard parts 93422 and 100422. They both require one single standard supply source and are designed with sufficient margins to operate over a wide temperature and supply range. These RAMs are fabricated with E/D (enhancement/depletion) MESFET technology, and functionality yields of 50% are typically obtained. Access time as low as 2.5 ns has been measured on these RAMS. Worst-case t/sub AA/ measured was 4 ns for the TTL I/O RAM and 3 ns for the ECL I/O RAM at room temperature. The RAMs are functional at case temperature from -5 to +85 degrees C, with 10% supply variation. Power dissipation is approximately 1.5 W for both RAMs.<>
Keywords :
III-V semiconductors; field effect integrated circuits; gallium arsenide; integrated circuit technology; integrated memory circuits; random-access storage; -5 to 85 C; 1.5 W; 100422 replacement; 2.5 to 4 ns; 4 kbit; 93422 replacement; E/D MESFET technology; ECL SRAMs; ECL compatibility; GaAs devices; TTL SRAMs; TTL compatibility; drop-in replacements; enhancement/depletion; functionality yields; industry standard parts; margins; room temperature; semiconductors; single standard supply source; static random-access memories; wide supply voltage range; wide temperature range; Electricity supply industry; Gallium arsenide; Logic; MESFETs; Power dissipation; Power supplies; Random access memory; Silicon; Temperature distribution; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1988. Technical Digest 1988., 10th Annual IEEE
Conference_Location :
Nashville, Tennessee, USA
Type :
conf
DOI :
10.1109/GAAS.1988.11028
Filename :
11028
Link To Document :
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