DocumentCode :
2567346
Title :
Qualification of surface mount technologies for random vibration in environmental stress screens
Author :
Kyser, Edmond L.
Author_Institution :
Tandem Comput. Inc., Cupertino, CA, USA
fYear :
1997
fDate :
13-16 Jan 1997
Firstpage :
237
Lastpage :
241
Abstract :
High density surface mount technologies such as ball grid array and column grid array are less robust with respect to random vibration stress than leaded surface mount devices. Intermittent failures can occur under vibration stress that are not detectable when the stress is removed. The devices are more vulnerable to vibration stresses at high temperature (80°C) than at low (-30°C). Guidelines for optimized vibration levels in environmental stress screens can be determined from damage data obtained using Miner´s rule
Keywords :
dynamic testing; environmental stress screening; printed circuit testing; surface mount technology; Miner´s rule; damage data; environmental stress screens; high density surface mount technologies; high temperature; intermittent failures; multi-layer printed wiring board; optimized vibration levels; random vibration; random vibration stress; Ceramics; Connectors; Electronic switching systems; Electronics packaging; Plastics; Qualifications; Stress; Surface-mount technology; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location :
Philadelphia, PA
ISSN :
0149-144X
Print_ISBN :
0-7803-3783-2
Type :
conf
DOI :
10.1109/RAMS.1997.571714
Filename :
571714
Link To Document :
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