Title :
Safe BDD Minimization Using Don´t Cares
Author :
Hong, Youpyo ; Beerel, Peter A. ; Burch, Jerry R. ; McMillan, Kenneth L.
Author_Institution :
Department of Electrical Engineering - Systems University of Southern California
Keywords :
Binary decision diagrams; Boolean functions; Data structures; Design automation; Distributed control; Laboratories; Logic testing; Minimization methods; Permission; Runtime;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-4093-0
DOI :
10.1109/DAC.1997.597145