Title :
Introducing S-parameters for ultrasound-based structural health monitoring
Author :
Haiying Huang ; Bednorz, Thilo
Author_Institution :
Dept. of Mech. & Aerosp. Eng., Univ. of Texas at Arlington, Arlington, TX, USA
Abstract :
Scattering parameters (S-parameters) are the most common tools for characterizing microwave devices and high-frequency systems but have not been used for ultrasoundbased structural health monitoring (SHM) so far. In this paper, we present the theory, signal processing algorithms, and experimental results to demonstrate the applications of S-parameters for three common ultrasound-based SHM techniques, i.e., ultrasound pitch-catch, pulse-echo, and impedance/admittance measurements. The concept of the S-parameters is first introduced, followed by the discussions of extracting the time-domain ultrasound signals from the frequency-domain Sparameter measurements. The time-domain signals calculated from the measured S-parameters were compared with the oscilloscope measurements. Excellent agreements between these two sets of measurements were achieved. In addition, time-frequency analysis of the ultrasound inspection system based on the S-parameter measurements has also been performed. This work demonstrated that the S-parameters can serve as a versatile tool for ultrasound-based SHM.
Keywords :
S-parameters; acoustic signal processing; condition monitoring; inspection; structural engineering; time-frequency analysis; ultrasonic materials testing; frequency-domain scattering parameter measurements; high-frequency systems; impedance-admittance measurements; microwave devices; oscilloscope measurements; pulse-echo; signal processing algorithms; time-domain ultrasound signals; time-frequency analysis; ultrasound inspection system; ultrasound pitch-catch; ultrasound-based structural health monitoring techniques; Frequency measurement; Oscilloscopes; Ports (Computers); Scattering parameters; Time-domain analysis; Ultrasonic imaging; Ultrasonic variables measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2014.006556