• DocumentCode
    25680
  • Title

    Introducing S-parameters for ultrasound-based structural health monitoring

  • Author

    Haiying Huang ; Bednorz, Thilo

  • Author_Institution
    Dept. of Mech. & Aerosp. Eng., Univ. of Texas at Arlington, Arlington, TX, USA
  • Volume
    61
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov-14
  • Firstpage
    1856
  • Lastpage
    1863
  • Abstract
    Scattering parameters (S-parameters) are the most common tools for characterizing microwave devices and high-frequency systems but have not been used for ultrasoundbased structural health monitoring (SHM) so far. In this paper, we present the theory, signal processing algorithms, and experimental results to demonstrate the applications of S-parameters for three common ultrasound-based SHM techniques, i.e., ultrasound pitch-catch, pulse-echo, and impedance/admittance measurements. The concept of the S-parameters is first introduced, followed by the discussions of extracting the time-domain ultrasound signals from the frequency-domain Sparameter measurements. The time-domain signals calculated from the measured S-parameters were compared with the oscilloscope measurements. Excellent agreements between these two sets of measurements were achieved. In addition, time-frequency analysis of the ultrasound inspection system based on the S-parameter measurements has also been performed. This work demonstrated that the S-parameters can serve as a versatile tool for ultrasound-based SHM.
  • Keywords
    S-parameters; acoustic signal processing; condition monitoring; inspection; structural engineering; time-frequency analysis; ultrasonic materials testing; frequency-domain scattering parameter measurements; high-frequency systems; impedance-admittance measurements; microwave devices; oscilloscope measurements; pulse-echo; signal processing algorithms; time-domain ultrasound signals; time-frequency analysis; ultrasound inspection system; ultrasound pitch-catch; ultrasound-based structural health monitoring techniques; Frequency measurement; Oscilloscopes; Ports (Computers); Scattering parameters; Time-domain analysis; Ultrasonic imaging; Ultrasonic variables measurement;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2014.006556
  • Filename
    6945635