DocumentCode :
2568084
Title :
Rapid Frequency-domain Analog Fault Simulation Under Parameter Tolerances
Author :
Tian, Michael W. ; Shi, C. J Richard
Author_Institution :
University of Iowa
fYear :
1997
fDate :
9-13 June 1997
Firstpage :
275
Lastpage :
280
Keywords :
Analog circuits; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Frequency; Numerical simulation; Permission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
0-7803-4093-0
Type :
conf
DOI :
10.1109/DAC.1997.597157
Filename :
597157
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2568084
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