DocumentCode :
2568092
Title :
A multi-objective decision making on reliability growth planning for in-service systems
Author :
Jin, Tongdan ; Wang, Haibo
Author_Institution :
Ingram Sch. of Eng., Texas State Univ. - San Marcos, San Marcos, TX, USA
fYear :
2009
fDate :
11-14 Oct. 2009
Firstpage :
4677
Lastpage :
4683
Abstract :
New designs prioritized for the fast time-to-market usually can not carry out sufficient in-house reliability growth testing due to the stringent delivery deadline. Reliability improvement for those systems can be achieved by implementing corrective actions (CAs) on in-service systems. In this paper, three types of effectiveness functions are proposed to measure the reduction rate of failure modes given different CA resources. Integrated with the effectiveness function, a new failure intensity model is proposed for predicting the mean-time-between-failures (MTBF) of field systems. Finally, a multi-objective optimization model is formulated to maximize the system reliability and to minimize the reliability uncertainty with the constraint of the CA resources. Genetic algorithms combined with greedy heuristic are applied to search the optimal CA decisions that lead to the maximum reliability growth while minimizing the reliability uncertainty. Results show that the proposed reliability growth program can effectively guide decision-makers to find the most effective corrective actions for achieving the reliability goal for a large fleet of in-service systems. Throughout paper, systems and products will be used interchangeably.
Keywords :
automatic test equipment; decision making; decision theory; failure analysis; genetic algorithms; greedy algorithms; life testing; minimisation; planning; reliability; search problems; time to market; ATE system fleet; MTBF prediction; corrective action; delivery deadline; effectiveness function; failure intensity model; failure mode reduction rate; genetic algorithm; greedy heuristic; in-house reliability growth testing; in-service system design; maximum reliability growth planning; mean-time-between-failure prediction; multiobjective decision making; multiobjective optimization model; optimal CA decision search; reliability uncertainty minimization; system reliability improvement; system reliability maximization; time-to-market; Computer aided manufacturing; Costs; Decision making; Hardware; Instruments; Reliability engineering; Semiconductor device manufacture; Semiconductor device testing; System testing; USA Councils; corrective actions; optimization; reliability growth;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man and Cybernetics, 2009. SMC 2009. IEEE International Conference on
Conference_Location :
San Antonio, TX
ISSN :
1062-922X
Print_ISBN :
978-1-4244-2793-2
Electronic_ISBN :
1062-922X
Type :
conf
DOI :
10.1109/ICSMC.2009.5346110
Filename :
5346110
Link To Document :
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