Title :
A non-contacting probe for measurements on high-frequency planar circuits
Author :
Osofsky, S.S. ; Schwarz, S.E.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
A novel magnetic-field probe for internal measurements on high-frequency planar circuits has been designed and tested. It requires no electrical contact with the circuit and has little or no effect on the circuit under test. Using this probe, circuit operation can be verified, and S-parameters of embedded passive and active components can be measured. Amplitudes and phases of currents at arbitrary positions can be measured. Using microfabrication techniques, working probes have been constructed for measurements in the 26.5-40.0-GHz band. Performance characteristics and typical measurements are described. Direct measurements obtained with these probes provide new information on internal circuit operation. The technique can be applied to rapid production testing.<>
Keywords :
S-parameters; integrated circuit testing; magnetic field measurement; microwave integrated circuits; probes; 26.5 to 40 GHz; S-parameters; circuit operation; high-frequency planar circuits; internal circuit operation; magnetic-field probe; microfabrication techniques; non-contacting probe; production testing; Circuit testing; Coplanar waveguides; Current measurement; Electronic equipment testing; MMICs; Magnetic field measurement; Magnetic fields; Microstrip; Probes; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38849
