Title :
ESD and latchup: Computer aided design (CAD) tools and methodologies for today and future VLSI designs
Author :
Voldman, Steven H.
Abstract :
In summary, new methods for ESD and latchup analysis are being utilized to address today´s technical problems in products, and design tools. As semiconductor tool and product complexity increases, future concepts are needed to address system on chip integration problems.
Keywords :
VLSI; circuit CAD; electrostatic discharge; chip integration problem; computer aided design; electrostatic discharge; latchup analysis; Application software; Circuit noise; Design automation; Design methodology; Digital circuits; Diodes; Electrostatic discharge; RF signals; Radio frequency; Very large scale integration;
Conference_Titel :
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-1132-0
Electronic_ISBN :
978-1-4244-1132-0
DOI :
10.1109/ICASIC.2007.4415645
