• DocumentCode
    2568456
  • Title

    ESD and latchup: Computer aided design (CAD) tools and methodologies for today and future VLSI designs

  • Author

    Voldman, Steven H.

  • fYear
    2007
  • fDate
    22-25 Oct. 2007
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    In summary, new methods for ESD and latchup analysis are being utilized to address today´s technical problems in products, and design tools. As semiconductor tool and product complexity increases, future concepts are needed to address system on chip integration problems.
  • Keywords
    VLSI; circuit CAD; electrostatic discharge; chip integration problem; computer aided design; electrostatic discharge; latchup analysis; Application software; Circuit noise; Design automation; Design methodology; Digital circuits; Diodes; Electrostatic discharge; RF signals; Radio frequency; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2007. ASICON '07. 7th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-1132-0
  • Electronic_ISBN
    978-1-4244-1132-0
  • Type

    conf

  • DOI
    10.1109/ICASIC.2007.4415645
  • Filename
    4415645
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2568456