Title :
Time Resolved Radiographic Spot Size Measurements of the Self-MAgnetic Pinch Diode using a Multi-Frame Fast Gating ICCD Camera System
Author :
Critchley, A.D.J. ; Crotch, I.R. ; Jones, A.W.P. ; Threadgold, J.R.
Author_Institution :
Dept. of Hydrodynamics, AWE Aldermaston
Abstract :
Summary form only given. The nanosecond gating controller (NSGC) camera system has been used to observe the time-resolved radiographic spot behavior of the self-magnetic pinch (SMP) diode, operating on the EROS (AWE Aldermaston) and RITS (Sandia National Laboratories) multi-megavolt flash X-ray generators. Images of scintillations produced by the X-ray spot with 3-5 ns exposure times have been recorded. Details of the development of the diagnostic from a 4- to 9-frame capability, as well as its application to the flash X-ray environment are described. Observations of the SMP diode X-ray spot size and wander as a function of time relative to the observable dose threshold are presented and compared to large scale plasma (LSP) 2D and 3D code predictions. The influence of the experimental results on current understanding of SMP diode operation is discussed, with the role of anode plasmas on the electron beam explored
Keywords :
electron beams; pinch effect; plasma X-ray sources; plasma diagnostics; plasma diodes; plasma-beam interactions; 3 to 5 ns; LSP code; anode plasmas; electron beam; multiframe fast gating ICCD camera; multimegavolt flash X-ray generators; self-magnetic pinch diode; time resolved radiographic spot size measurements; Cameras; Control systems; Diagnostic radiography; Diodes; Laboratories; Large-scale systems; Plasma x-ray sources; Radio control; Size measurement; X-ray imaging;
Conference_Titel :
Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-9300-7
DOI :
10.1109/PLASMA.2005.359174
