Title :
An integrated channel noise-based true random number generator
Author :
Eberlein, Matthias ; Bakar, Rosnany Abu
Author_Institution :
Malaysia Microelectron. Solutions, Cyberjaya
Abstract :
The circuit described retrieves true random numbers from CMOS channel noise, suitable for Smart Card applications. The new concept uses MOS transistors in subthreshold and linear region, and applies continuous time offset cancellation. By this technique a high, well defined gain and small area is achieved simultaneously. A two-stage amplifier architecture ensures low sensitivity to supply and substrate noise. The presented solution is simple and does not require tuning. It was implemented in a 0.18 mum SMIC process, consuming only 25 muW with a 1.8 V supply. Good entropy values can be obtained with sampling frequencies up to 5 MHz.
Keywords :
CMOS integrated circuits; MOSFET; amplifiers; digital arithmetic; integrated circuit noise; random number generation; CMOS channel noise; MOS transistors; SMIC process; Smart Card application; continuous time offset cancellation; integrated channel noise-based true random number generator; linear region; substrate noise; subthreshold region; two-stage amplifier architecture; Circuits; Entropy; Low-noise amplifiers; MOSFETs; Noise cancellation; Noise generators; Random number generation; Sampling methods; Smart cards; Tuning;
Conference_Titel :
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-1132-0
Electronic_ISBN :
978-1-4244-1132-0
DOI :
10.1109/ICASIC.2007.4415649