Title :
Accuracy factors in microwave noise parameter measurements
Author :
Davidson, A. ; Leake, B. ; Strid, E.
Author_Institution :
Cascade Microtech. Inc., Beaverton, OR, USA
Abstract :
The authors have investigated various factors responsible for inaccuracies in microwave noise parameter measurements, including the number of source admittances, the position of the admittances on the Smith chart in relation to DUT (device under test) parameters, the accuracy of the source admittances and device S-parameters, and the effect of changing noise source impedances. It is shown that the test source impedances do not need to be grouped around the impedance for minimum noise. Calibration and DUT S-parameter accuracy is shown to be important to the noise parameter accuracy. A novel algorithm has been implemented which corrects for different noise source ´on´ and ´off´ impedances. The feasibility of noise parameter measurements with less than 0.1-dB variations of F/sub min/ with frequency with high throughput has been shown.<>
Keywords :
S-parameters; electric noise measurement; microwave measurement; DUT; S-parameters; Smith chart; microwave noise parameter measurements; noise parameter accuracy; noise source impedances; source admittances; throughput; Acoustic reflection; Circuit noise; Gain measurement; Impedance measurement; Microwave measurements; Noise figure; Noise measurement; Power measurement; Scattering parameters; Tuners;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38850