• DocumentCode
    2568664
  • Title

    Temperature dependent characteristics of the JPL silicon MEMS gyroscope

  • Author

    Shcheglov, K. ; Evans, Christopher ; Gutierrez, Roman ; Tang, Tony K.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    403
  • Abstract
    Advances in aeronautics and space technology have created a need for miniaturized navigation instruments such as gyroscopes, a need which is currently being addressed by a number of micromachined designs. While micromachined devices have already proven their advantages being light-weight and low-power, the performance limitations of these devices have not been thoroughly investigated. In particular the effects of the temperature environment on the performance is of great interest since they can be a dominant source of error in micromachined devices. We have investigated the temperature-dependent drift and noise characteristics of a packaged silicon MEMS gyroscopes. Packaged devices were subjected to various temperatures environments between -60 and +60°C, and their resonant frequencies, signal drifts and quadrature drifts were monitored. The results obtained from these tests point out the mechanisms of temperature-dependent and temperature-independent drift and suggest a scheme for temperature compensation
  • Keywords
    aerospace instrumentation; aircraft navigation; elemental semiconductors; gyroscopes; microsensors; random noise; silicon; thermal management (packaging); -60 and +60°C; -60 to 60 C; JPL MEMS gyroscope; Si; Si packaged MEMS gyroscopes; micromachined devices; miniaturized navigation; noise characteristics; performance limitations; resonant frequencies; signal drifts; temperature compensation; temperature dependent characteristics; temperature-dependent drift; temperature-independent drift; Gyroscopes; Instruments; Micromechanical devices; Navigation; Packaging; Resonant frequency; Silicon; Space technology; Temperature dependence; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference Proceedings, 2000 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    0-7803-5846-5
  • Type

    conf

  • DOI
    10.1109/AERO.2000.879420
  • Filename
    879420