• DocumentCode
    2568732
  • Title

    A Back-Illuminated High-Sensitivity Small-Pixel Color CMOS Image Sensor with Flexible Layout of Metal Wiring

  • Author

    Iwabuchi, S. ; Maruyama, Y. ; Ohgishi, Y. ; Muramatsu, M. ; Karasawa, Nobuhiro ; Hirayama, Takatsugu

  • Author_Institution
    SONY, Atsugi
  • fYear
    2006
  • fDate
    6-9 Feb. 2006
  • Firstpage
    1171
  • Lastpage
    1178
  • Abstract
    A 1.3Mpixel color image sensor with a back-illuminated configuration and 3.45mum square pixels is fabricated in 0.25mum 1P3M CMOS. Its sensitivity at a wavelength of 550nm is 34% better than that of a conventional device, and it falls by only 15% when the light is incident at an angle of 20 degrees. Flexibility in metal wiring layout improves device characteristics such as saturation output
  • Keywords
    CMOS image sensors; wiring; 0.25 micron; 1P3M CMOS; 3.45 micron; 550 nm; back-illuminated configuration; color image sensor; metal wiring layout; small-pixel color CMOS image sensor; CMOS image sensors; Computational Intelligence Society; Degradation; Digital cameras; Image quality; Optical saturation; Optical sensors; Pixel; Silicon; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    1-4244-0079-1
  • Type

    conf

  • DOI
    10.1109/ISSCC.2006.1696162
  • Filename
    1696162