Title :
Large-signal characterization of millimeter-wave transistors using an active load-pull measurement system
Author :
Actis, R. ; McMorran, R.A. ; Murphy, R.A. ; Hollis, M.A. ; Chick, R.W. ; Bozler, C.O. ; Nichols, K.B.
Author_Institution :
MIT Lincoln Lab., Lexington, MA, USA
Abstract :
An automated measurement system is described for obtaining the load-pull characteristics of high-speed transistors at millimeter-wave frequencies. The method uses ´active tuning´ to vary the transistor output load impedance electronically. the large-scale characteristics of an 8-by-20- mu m permeable base transistor (PBT) have been measured with this method and applied to the design of 27-mW PBT amplifier at 40.1 GHz.<>
Keywords :
bipolar transistors; microwave amplifiers; solid-state microwave circuits; solid-state microwave devices; 27 mW; 40.1 GHz; PBT amplifier; active load-pull measurement system; automated measurement system; high-speed transistors; millimeter-wave transistors; permeable base transistor; transistor output load impedance; Frequency; Heterojunction bipolar transistors; Impedance; Microwave measurements; Microwave transistors; Millimeter wave measurements; Millimeter wave technology; Millimeter wave transistors; Permeability measurement; Tuners;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38852
