Automatic Positioning Device Design for the Operation Platform of Nano-indentation

Author

Weng, Yung-Jin ; Weng, Yung-Chun ; Fang, Huang-Sheng ; Wong, Yong-Cheng ; Ke, Chih-Yu ; Liu, Hsu-Kang

Author_Institution

Center for Gen. Educ., Kainan Univ., Taoyuan, Taiwan

fYear

2009

fDate

15-17 May 2009

Firstpage

913

Lastpage

916

Abstract

In this paper, we try to measure the differences among the indentations of single crystal bulks under different rotation angles by nanoindentation test. Besides, we also give a design of positioning device for the nanoindentation measuring system. It is driven by stepping motors and relevant circuits for controlling the rotations of the wafer supporting platform. The drive circuit is connected with microprocessors. The rotation angle of the platform can be adjusted by instructions so that the system can be used to carry out nanoindentation tests in different angles for more precise mechanical properties data of the nanoindentation materials.

Keywords

automatic testing; mechanical testing; nanoindentation; nanopositioning; nanostructured materials; automatic positioning device design; mechanical properties; microprocessors; nanoindentation; operation platform; rotation angles; single crystal bulks; wafer supporting platform; Crystalline materials; Crystallization; Educational technology; Force measurement; Grain boundaries; Materials testing; Mechanical factors; Nanoscale devices; Nanostructured materials; Titanium; Automatic positioning device; Directivity effect; Nanoindentation; Single crystal;

fLanguage

English

Publisher

ieee

Conference_Titel

2009 International Conference on Signal Processing Systems

Conference_Location

Singapore

Print_ISBN

978-0-7695-3654-5

Type

conf

DOI

10.1109/ICSPS.2009.186

Filename

5166924