• DocumentCode
    2570565
  • Title

    Measurement of Spectra of X-Ray Emitted from Neon Plasma

  • Author

    Zhang, Guixin ; Sing Lee ; Lee, Sing

  • Author_Institution
    Dept. of EEA, Tsinghua Univ., Beijing
  • fYear
    2005
  • fDate
    20-23 June 2005
  • Firstpage
    237
  • Lastpage
    237
  • Abstract
    Summary form only given. In this paper the experimental results of measuring spectra of X-ray emitted from neon plasma will be presented and discussed. Two methods have been employed for this purpose: (1) flat crystal spectrography; (2) filtered 5-channel PIN diode detector. The crystal spectrograph has an adjustment system of five degrees of freedom. It has not only the advantage of easy adjustment, high efficiency and high spectral resolution, but also the capability of providing spatially resolved spectrum in one dimension over 1~50 Aring wavelength range. A TIAP crystal was used, and the spatially resolved X-ray spectra from a neon plasma focus were obtained
  • Keywords
    neon; plasma X-ray sources; plasma diagnostics; plasma focus; Ne; X-ray spectra; filtered 5-channel PIN diode detector; flat crystal spectrography; neon plasma focus; Detectors; Ignition; Neutrons; Plasma confinement; Plasma measurements; Plasma waves; Plasma x-ray sources; Spatial resolution; X-ray imaging; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-9300-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.2005.359302
  • Filename
    4198561