DocumentCode
2570565
Title
Measurement of Spectra of X-Ray Emitted from Neon Plasma
Author
Zhang, Guixin ; Sing Lee ; Lee, Sing
Author_Institution
Dept. of EEA, Tsinghua Univ., Beijing
fYear
2005
fDate
20-23 June 2005
Firstpage
237
Lastpage
237
Abstract
Summary form only given. In this paper the experimental results of measuring spectra of X-ray emitted from neon plasma will be presented and discussed. Two methods have been employed for this purpose: (1) flat crystal spectrography; (2) filtered 5-channel PIN diode detector. The crystal spectrograph has an adjustment system of five degrees of freedom. It has not only the advantage of easy adjustment, high efficiency and high spectral resolution, but also the capability of providing spatially resolved spectrum in one dimension over 1~50 Aring wavelength range. A TIAP crystal was used, and the spatially resolved X-ray spectra from a neon plasma focus were obtained
Keywords
neon; plasma X-ray sources; plasma diagnostics; plasma focus; Ne; X-ray spectra; filtered 5-channel PIN diode detector; flat crystal spectrography; neon plasma focus; Detectors; Ignition; Neutrons; Plasma confinement; Plasma measurements; Plasma waves; Plasma x-ray sources; Spatial resolution; X-ray imaging; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
Conference_Location
Monterey, CA
ISSN
0730-9244
Print_ISBN
0-7803-9300-7
Type
conf
DOI
10.1109/PLASMA.2005.359302
Filename
4198561
Link To Document