Title :
Channelized coplanar waveguide: discontinuities, junctions, and propagation characteristics
Author :
Simons, R.N. ; Ponchak, G.E. ; Martzaklis, K.S. ; Romanofsky, R.R.
Author_Institution :
NASA, Cleveland, OH, USA
Abstract :
The authors present lumped-element circuit models for several CCPW (channelized coplanar waveguide) discontinuities, together with their element values as a function of frequency. The discontinuities characterized are an open circuit and a right-angle bend. The measured frequency dependence of the effective dielectric constant, epsilon (eff), and the unloaded quality factor, Q, are also presented for CCPW lines fabricated on epsilon (r)=2.2+or-0.02 RT/Duroid 5880, epsilon (r)=6.0+or-0.15 RT/Duroid 6006, and epsilon (r)=10.2+or-0.025 3M Epsilam-10 substrates. Attention is then given to the design and characterization of CCPW T-junction and 1-to-3 in-phase, matched power divider. The performance of a novel coax-to-CCPW in-phase, N-way radial power divider circuit is also presented.<>
Keywords :
Q-factor; permittivity; waveguide components; waveguide couplers; waveguides; Duroid 5880; Duroid 6006; Epsilam-10 substrates; T-junction; channelized coplanar waveguide; discontinuities; effective dielectric constant; frequency dependence; lumped-element circuit models; matched power divider; open circuit; propagation characteristics; radial power divider circuit; right-angle bend; unloaded quality factor; Circuits; Coplanar waveguides; Dielectric constant; Dielectric measurements; Frequency dependence; Frequency measurement; Power dividers; Q measurement; Waveguide discontinuities; Waveguide junctions;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38871