Title :
Power Distribution Measurements of the Dual Core PowerPC/sup TM/ 970MP Microprocessor
Author :
Hamann, Hendrik F. ; Weger, Alan ; Lacey, James ; Cohen, Erwin ; Atherton, Craig
Author_Institution :
IBM, Yorktown Heights, NY
Abstract :
Spatially-resolved imaging of microprocessor power (SIMP) is shown to be a critical tool for measuring temperature and power distributions of a microprocessor under full operating conditions. In this paper, the SIMP technique is applied to the dual-core PowerPCtrade 970MP microprocessor
Keywords :
microprocessor chips; power measurement; temperature measurement; dual core PowerPC 970MP microprocessor; power distribution measurements; spatially-resolved imaging microprocessor power; temperature measurement; Cooling; Electrical resistance measurement; Microprocessors; Power distribution; Power measurement; Semiconductor device measurement; Spatial resolution; Temperature distribution; Temperature measurement; Thermal resistance;
Conference_Titel :
Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0079-1
DOI :
10.1109/ISSCC.2006.1696278
