• DocumentCode
    2570951
  • Title

    Starbist Scan Autocorrelated Random Pattern Generation

  • Author

    Tsai, K.H. ; Hellebrand, S. ; Rajski, J. ; Marek-Sadowska, M.

  • Author_Institution
    University of California, Santa Barbara
  • fYear
    1997
  • fDate
    9-13 June 1997
  • Firstpage
    472
  • Lastpage
    477
  • Keywords
    Autocorrelation; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Degradation; Hardware; Logic design; Logic testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1997. Proceedings of the 34th
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    0-7803-4093-0
  • Type

    conf

  • DOI
    10.1109/DAC.1997.597194
  • Filename
    597194
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2570951