• DocumentCode
    2571056
  • Title

    The sensitivity of living tissue to microwave field

  • Author

    Hinrikus, Hiie ; Lass, Jaanus ; Riipulk, Jevgeni

  • Author_Institution
    Biomed. Eng. Centre, Tallinn Tech. Univ., Estonia
  • Volume
    6
  • fYear
    1998
  • fDate
    29 Oct-1 Nov 1998
  • Firstpage
    3249
  • Abstract
    The fundamental electrical noise of living cells due to thermal and current carrier fluctuations is discussed. It is shown that the levels of thermal and shot noise at the cell´s membrane are comparable. The ionic channel opening-closing fluctuations can substantially increase the noise level and add an excess noise. The sensitivity of a typical cell is about of 10-8 W/m2. Numerical modelling of electromagnetic wave propagation in multilayered tissue is used for field level determination inside the body. The radiation density inside the body at a depth of 3-5 cm is 10-5-10-6 from this level near the surface at 4500 MHz frequency. Experiments with low-level extremely low frequency amplitude-modulated radiation at 450 MHz frequency are carried out
  • Keywords
    1/f noise; bioelectric phenomena; biological effects of microwaves; biological tissues; biomembrane transport; cellular effects of radiation; physiological models; shot noise; thermal noise; 450 MHz; 4500 MHz; current carrier fluctuations; electromagnetic wave propagation; excess noise; fundamental electrical noise; internal noise; ionic channels; living cells; living tissue; low-level ELF amplitude-modulated radiation; microwave field sensitivity; multilayered tissue; numerical modelling; opening-closing fluctuations; radiation density; shot noise; thermal fluctuations; thermal noise; Bandwidth; Biomedical engineering; Biomembranes; Electromagnetic radiation; Fluctuations; Frequency; Noise level; Organisms; Roads; Thermal engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
  • Conference_Location
    Hong Kong
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-5164-9
  • Type

    conf

  • DOI
    10.1109/IEMBS.1998.746188
  • Filename
    746188