DocumentCode :
2571062
Title :
A Hybrid Algorithm For Test Point Selection For Scan-based Bist
Author :
Tsai, Huan-Chih ; Cheng, Kwang-Ting ; Lin, Chih-Jen ; Bhawmik, Sudipta
Author_Institution :
University of California
fYear :
1997
fDate :
9-13 June 1997
Firstpage :
478
Lastpage :
483
Keywords :
Built-in self-test; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Cost function; Hardware; Permission; Test pattern generators; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
0-7803-4093-0
Type :
conf
DOI :
10.1109/DAC.1997.597195
Filename :
597195
Link To Document :
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