DocumentCode

2571062

Title

A Hybrid Algorithm For Test Point Selection For Scan-based Bist

Author

Tsai, Huan-Chih ; Cheng, Kwang-Ting ; Lin, Chih-Jen ; Bhawmik, Sudipta

Author_Institution

University of California

fYear

1997

fDate

9-13 June 1997

Firstpage

478

Lastpage

483

Keywords

Built-in self-test; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Cost function; Hardware; Permission; Test pattern generators; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1997. Proceedings of the 34th

Conference_Location

Anaheim, CA, USA

ISSN

0738-100X

Print_ISBN

0-7803-4093-0

Type

conf

DOI

10.1109/DAC.1997.597195

Filename

597195