Title :
A Hybrid Algorithm For Test Point Selection For Scan-based Bist
Author :
Tsai, Huan-Chih ; Cheng, Kwang-Ting ; Lin, Chih-Jen ; Bhawmik, Sudipta
Author_Institution :
University of California
Keywords :
Built-in self-test; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Cost function; Hardware; Permission; Test pattern generators; Timing;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-4093-0
DOI :
10.1109/DAC.1997.597195
