DocumentCode
2571100
Title
An on-chip monitor for hot carrier induced degradation
Author
Li, Xiao-Ming ; Zhuang, Yi-Qi ; Zhao, Jun-Hui ; Wang, Li
Author_Institution
Xidian Univ., Xian
fYear
2007
fDate
22-25 Oct. 2007
Firstpage
1002
Lastpage
1005
Abstract
An on-chip measurement circuit is proposed as a monitor to detect on-line HCD (hot-carrier induced degradation) here, which can be integrated and degraded with the host device, and give an alarm when the device need replacing. This is done prior to actual device failure and able to estimate down time of the system where this device is used, and it only needs a very small area.
Keywords
condition monitoring; failure analysis; hot carriers; semiconductor device reliability; device failure alarm; hot carrier induced degradation; on-chip measurement circuit; Circuits; Condition monitoring; Degradation; Delay; Equations; Frequency; Hot carriers; Microelectronics; Ring oscillators; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-1132-0
Electronic_ISBN
978-1-4244-1132-0
Type
conf
DOI
10.1109/ICASIC.2007.4415802
Filename
4415802
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