Title :
Towards a metrics based verification and validation maturity model
Author :
Jacobs, J.C. ; Trienekens, J.J.M.
Author_Institution :
Philips Semicond., Eindhoven, Netherlands
Abstract :
Verification and validation (V&V) is only marginally addressed in software process improvement models like CMM and CMMI. A roadmap for the establishment of a sound verification and validation process in software development organizations is badly needed. This paper presents a basis for a roadmap; it describes a framework for improvement of the V&V process, based on the Testing Maturity Model (TMM), but with considerable enhancements. The model, tentatively named MB-V2M2 (Metrics Based Verification and Validation Maturity Model), has been initiated by a consortium of industrial companies, consultancy & service agencies and an academic institute, operating and residing in the Netherlands. MB-V2M2 is designed to be universally applicable, to unite the strengths of known (verification and validation) improvement models and to reflect proven work practices. It recommends a metrics base to select process improvements and to track and control implementation of improvement actions. This paper outlines the model and addresses the current status.
Keywords :
program testing; program verification; software metrics; software process improvement; software reliability; CMM; CMMI; MB-V2M2; Metrics Based Verification and Validation Maturity Model; Netherlands; TMM; Testing Maturity Model; consultancy agency; industrial company consortium; metrics based model; service agency; software development organization; software process improvement; universally applicable design; verification and validation maturity model; Capability maturity model; Communication industry; Construction industry; Coordinate measuring machines; Electronic equipment testing; Jacobian matrices; Programming; Software measurement; Software quality; Software testing;
Conference_Titel :
Software Technology and Engineering Practice, 2002. STEP 2002. Proceedings. 10th International Workshop on
Print_ISBN :
0-7695-1878-8
DOI :
10.1109/STEP.2002.1267622