DocumentCode
2571634
Title
A New Approach to Characterize High Power Electromagnetic Waves Following Apertures Interactions
Author
Kirawanich, P. ; Gleason, D. ; Islam, N.E.
Author_Institution
Dept. of Electr. & Comput. Eng., Missouri Univ., Columbia, MO
fYear
2005
fDate
20-23 June 2005
Firstpage
270
Lastpage
270
Abstract
Summary form only given. External high power electromagnetic sources are threats to electrical systems used in both commercial and defense applications. Such an interaction with a very large electrical system can be simulated through a modular technique known as electromagnetic topology (EMT) that requires volume decomposition. In our presentation, we have demonstrated an improved electromagnetic EMT based simulation approach by integrating a transmission line matrix method to the topological simulation technique. This approach allows for the use of the topological code for fields propagations between electrical systems through mediums other than hard-wire cables. An array of cable network is created by the integration of the sub-network matrices based on the TLM network. The agreement of the simulated results with FDTD analysis validates the topological approach to simulation through volume decomposition. Analysis also shows that the aperture size affects field propagation and penetration, thus influencing both the field characteristics and frequency spectral components of the incident pulse
Keywords
electromagnetic wave propagation; finite difference time-domain analysis; transmission line matrix methods; FDTD analysis; aperture interactions; cable network array; electrical systems; electromagnetic topology; electromagnetic waves; hard-wire cables; modular technique; subnetwork matrices; transmission line matrix; volume decomposition; Analytical models; Apertures; Cables; Electromagnetic propagation; Electromagnetic scattering; Finite difference methods; Matrix decomposition; Time domain analysis; Topology; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
Conference_Location
Monterey, CA
ISSN
0730-9244
Print_ISBN
0-7803-9300-7
Type
conf
DOI
10.1109/PLASMA.2005.359359
Filename
4198618
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