DocumentCode :
257170
Title :
Block reinforcement to optimize lifetime of flash storage devices
Author :
Chien-Chung Ho ; Yuan-Hao Chang ; Che-Wei Tsao ; Pei-Lun Suei
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2014
fDate :
7-10 Oct. 2014
Firstpage :
717
Lastpage :
718
Abstract :
With the advances of manufacturing technology and aggressive use of multi-level-cell (MLC) for flash memory, flash memory has faced a serious challenge on its device lifetime due to the fast-decreasing capacity caused by worn-out blocks. In contrast to existing works, we propose a block reinforcement scheme to optimize the guaranteed lifetime of flash storage devices by extending the useable period of flash blocks with limited performance degradation and space overhead. A serious of experiments was conducted to evaluate the efficacy of the proposed scheme and the results are very encouraging.
Keywords :
flash memories; multivalued logic circuits; MLC; block reinforcement scheme; flash storage device lifetime optimization; multilevel-cell; performance degradation; worn-out blocks; Ash; Bit error rate; Error correction codes; Flash memories; Parity check codes; Performance evaluation; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics (GCCE), 2014 IEEE 3rd Global Conference on
Conference_Location :
Tokyo
Type :
conf
DOI :
10.1109/GCCE.2014.7031339
Filename :
7031339
Link To Document :
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