• DocumentCode
    2571717
  • Title

    Advanced wireless CMOS transceivers

  • fYear
    2006
  • fDate
    6-9 Feb. 2006
  • Firstpage
    2630
  • Lastpage
    2635
  • Keywords
    Built-in self-test; CMOS technology; Circuits; Design for testability; Energy consumption; Instruments; Logic testing; Manufacturing; Random access memory; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    1-4244-0079-1
  • Type

    conf

  • DOI
    10.1109/ISSCC.2006.1696331
  • Filename
    1696331
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2571717