Title :
Advanced wireless CMOS transceivers
Keywords :
Built-in self-test; CMOS technology; Circuits; Design for testability; Energy consumption; Instruments; Logic testing; Manufacturing; Random access memory; Transceivers;
Conference_Titel :
Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0079-1
DOI :
10.1109/ISSCC.2006.1696331
