DocumentCode :
2571730
Title :
Measurements of the K Continuum for Argon Z-Pinches
Author :
Coleman, Philip ; Bixler, A. ; Jarema, A. ; Knight, Joseph ; Lee, Sang-Rim ; Krishnan, Mohan ; Thompson, John ; Rauch, J. ; Rauch, Michael ; Failor, B. ; Levine, John ; Niansheng Qi ; Verma, A.
Author_Institution :
Alameda Appl. Sci. Corp., San Leandro, CA
fYear :
2005
fDate :
20-23 June 2005
Firstpage :
272
Lastpage :
272
Abstract :
Summary form only given. While the characteristic "resonance" lines dominate the K-shell X-ray emission from Z pinches, the energy in the K continuum (free-bound and free-free transitions) can be significant. A simple model implies that the continuum could supply well over 10% of the K-shell yield if the plasma is warm enough and dense enough. We present here new measurements of the continuum strength for argon implosions. The data were taken at peak currents of 3.5 MA with implosion times exceeding 200 ns. Heavily filtered GaAs photoconductive detectors (PCD) were used as direct measures of the argon continuum above ~4 keV. Other major diagnostics included X-ray power sensors, calorimeters, time-integrated CCD spectra and CCD pinhole images. By combining the data from all of these instruments, we have derived the strength and temperature of the continuum as well as the yield in the K-lines using a self-consistent method. As implosion conditions changed, the changes seen in electron temperature (derived from K-line ratios) were not as large as the changes seen in the continuum temperature (derived from the PCDs). The yield in the continuum was close to a linear function of the K yield. The relative strength of the continuum does appear to depend on the detailed mass distributions produced by the 12 cm diameter nozzles used for these tests
Keywords :
Z pinch; argon; explosions; plasma X-ray sources; plasma diagnostics; plasma temperature; 12 cm; 3.5 MA; Ar; CCD pinhole images; GaAs photoconductive detectors; K continuum; K-shell X-ray emission; X-ray power sensors; argon Z-pinches; argon implosions; calorimeters; electron temperature; free-bound transition; free-free transition; mass distributions; resonance lines; time-integrated CCD spectra; Argon; Charge coupled devices; Gallium arsenide; Plasma density; Plasma measurements; Plasma properties; Plasma temperature; Plasma x-ray sources; Resonance; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
Conference_Location :
Monterey, CA
ISSN :
0730-9244
Print_ISBN :
0-7803-9300-7
Type :
conf
DOI :
10.1109/PLASMA.2005.359363
Filename :
4198622
Link To Document :
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