DocumentCode :
2571739
Title :
Sequential equivalence techniques for high performance design
Author :
Balakrishnan, Sini
Author_Institution :
Senior Design Eng. Infineon Technol., Bangalore
fYear :
2007
fDate :
22-25 Oct. 2007
Firstpage :
1162
Lastpage :
1165
Abstract :
Quite often in semiconductor industry, when a product is nearing its launch date, most of us have had the deja-vu situation of performance to time-to-market trade-offs; especially in high-performance designs. Sequential equivalence checking opens up possibilities in this area, by enabling performance-tuning related sequential micro-architectural changes to be verified with significantly lower impact on effort estimates and risk. This nascent technology promises to change the way we look at eleventh hour changes.
Keywords :
logic design; logic testing; RTL; high performance design; performance-tuning; semiconductor industry; sequential equivalence techniques; sequential microarchitectural changes; time-to-market trade-offs; Buildings; Computer bugs; Design engineering; Design methodology; Electronics industry; Sequential analysis; Testing; Time to market; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-1132-0
Electronic_ISBN :
978-1-4244-1132-0
Type :
conf
DOI :
10.1109/ICASIC.2007.4415840
Filename :
4415840
Link To Document :
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