• DocumentCode
    2572056
  • Title

    LPCVD polysilicon films with controlled curvature for optical MEMS: the MultiPolyTM process

  • Author

    Heuer, A.H.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    117
  • Lastpage
    118
  • Abstract
    A new technique is presented for producing polysilicon films with predetermined stress profiles. Polysilicon films deposited by LPCVD exhibit tensile or compressive residual stresses, depending on the deposition temperature. Polysilicon films comprised of alternating tensile and compressive layers can display any overall value of stress and stress gradient. We call the multilayer material MultiPolyTM and the process the MultiPolyTM process. Structures made from these films can be designed to display deliberate curvatures as-fabricated resulting in novel optical devices, such as focusing mirrors. Electrostatic actuation can be used to modify the shapes of these polysilicon structures, creating optical switches
  • Keywords
    CVD coatings; chemical vapour deposition; elemental semiconductors; internal stresses; micro-optics; mirrors; optical multilayers; optical switches; semiconductor growth; semiconductor thin films; silicon; LPCVD polysilicon films; MultiPoly process; Si; alternating tensile/compressive layers; compressive residual stresses; controlled curvature; deposition temperature dependence; electrostatic actuation; focusing mirrors; multilayer material; optical MEMS; optical switches; predetermined stress profiles; tensile residual stresses; Compressive stress; Displays; Micromechanical devices; Nonhomogeneous media; Optical control; Optical films; Optical materials; Residual stresses; Temperature dependence; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS, 2000 IEEE/LEOS International Conference on
  • Conference_Location
    Kauai, HI
  • Print_ISBN
    0-7803-6257-8
  • Type

    conf

  • DOI
    10.1109/OMEMS.2000.879654
  • Filename
    879654