DocumentCode
2572106
Title
A novel high level testability synthesis method based on PSA
Author
Yuan-chen, LI
Author_Institution
Luoyang Normal Univ., Luoyang
fYear
2007
fDate
22-25 Oct. 2007
Firstpage
1249
Lastpage
1252
Abstract
A novel high level testability synthesis method based on PSA (polynomial symbolic algebra) was developed in the paper, it first obtained the circuit description based on PSA, then got the testable structure representation with inserted BIST structures. After the testability analysis, an integrated schedule and allocation algorithm based on polynomial symbolic algebra was formulated. The algorithm got the final netlist description at last. And it could reduce test time and hardware overhead, the experiment results have proved the efficiency of the proposed method.
Keywords
built-in self test; high level synthesis; polynomials; BIST structure; high level testability synthesis; polynomial symbolic algebra; Algebra; Built-in self-test; Circuit synthesis; Circuit testing; Equations; High level synthesis; Integrated circuit modeling; Integrated circuit synthesis; Polynomials; Taylor series;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-1132-0
Electronic_ISBN
978-1-4244-1132-0
Type
conf
DOI
10.1109/ICASIC.2007.4415862
Filename
4415862
Link To Document