Title :
Application of a Lagrangian relaxation based scheduling algorithm to a semiconductor testing facility
Author :
Kaskavelis, Chrisms A. ; Caramanis, Michael C.
Author_Institution :
Dept. of Manuf. Eng., Boston Univ., MA, USA
Abstract :
The objective of this study is the scheduling of the analog devices testing section of a production plant. The facility under study can be characterized as a high volume job shop, one of the most difficult production systems to schedule. Reentrant flow, variable daily capacity, and the need of multiple scarce resources for each operation, increase the difficulty of the scheduling problem. A Lagrangian relaxation based algorithm is proposed for scheduling the facility. The algorithm is efficient, flexible in handling the relevant modeling issues, and provides superior results when compared with simple dispatching rules which represent current industry practice
Keywords :
analogue integrated circuits; dynamic programming; iterative methods; minimisation; production control; relaxation theory; semiconductor device testing; Lagrangian relaxation based scheduling algorithm; analog devices testing; dispatching rules; high volume job shop; multiple scarce resources; reentrant flow; semiconductor testing facility; Cost function; Job production systems; Job shop scheduling; Lagrangian functions; Manufacturing industries; Manufacturing systems; Scheduling algorithm; Semiconductor device manufacture; Semiconductor device testing; Time measurement;
Conference_Titel :
Computer Integrated Manufacturing and Automation Technology, 1994., Proceedings of the Fourth International Conference on
Conference_Location :
Troy, NY
Print_ISBN :
0-8186-6510-6
DOI :
10.1109/CIMAT.1994.389086
