DocumentCode
2572352
Title
Fast signal separation circuit for a high-speed signal integrity test system
Author
Nastase, Adrian S. ; Nelson, Ronald L.
Author_Institution
Newport Corp., Irvine, CA, USA
Volume
2
fYear
2002
fDate
2002
Firstpage
377
Abstract
This paper presents a fast test circuit that uses analog signal processing techniques to separate and measure the amplitude of one frequency component of a complex signal. It is intended for high volume test systems, and can be used for magnetic media evaluations, signal integrity and communication channels characterization.
Keywords
analogue processing circuits; production testing; signal processing equipment; test equipment; analog signal processing techniques; communication channel characterization; complex signals; fast signal separation circuit; high volume test systems; high-speed test system; magnetic media evaluations; signal integrity test system; Circuit testing; Digital signal processing; Frequency measurement; Lakes; Low pass filters; Performance evaluation; Signal processing; Source separation; Synthesizers; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2002. CAS 2002 Proceedings. International
Print_ISBN
0-7803-7440-1
Type
conf
DOI
10.1109/SMICND.2002.1105872
Filename
1105872
Link To Document