Title :
Fast signal separation circuit for a high-speed signal integrity test system
Author :
Nastase, Adrian S. ; Nelson, Ronald L.
Author_Institution :
Newport Corp., Irvine, CA, USA
Abstract :
This paper presents a fast test circuit that uses analog signal processing techniques to separate and measure the amplitude of one frequency component of a complex signal. It is intended for high volume test systems, and can be used for magnetic media evaluations, signal integrity and communication channels characterization.
Keywords :
analogue processing circuits; production testing; signal processing equipment; test equipment; analog signal processing techniques; communication channel characterization; complex signals; fast signal separation circuit; high volume test systems; high-speed test system; magnetic media evaluations; signal integrity test system; Circuit testing; Digital signal processing; Frequency measurement; Lakes; Low pass filters; Performance evaluation; Signal processing; Source separation; Synthesizers; System testing;
Conference_Titel :
Semiconductor Conference, 2002. CAS 2002 Proceedings. International
Print_ISBN :
0-7803-7440-1
DOI :
10.1109/SMICND.2002.1105872
