• DocumentCode
    2572476
  • Title

    Hierarchical Test Generation And Design For Testability Of ASPPs and ASIPs

  • Author

    Ghosh, Indradeep ; Raghunathan, Anand ; Jha, Niraj K.

  • Author_Institution
    Princeton University, Princeton, NJ 08544
  • fYear
    1997
  • fDate
    9-13 June 1997
  • Firstpage
    534
  • Lastpage
    539
  • Keywords
    Application specific processors; Circuit faults; Circuit testing; Design for testability; Digital signal processing; Permission; Read-write memory; Registers; Sequential analysis; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1997. Proceedings of the 34th
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    0-7803-4093-0
  • Type

    conf

  • DOI
    10.1109/DAC.1997.597205
  • Filename
    597205
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2572476