DocumentCode :
2572476
Title :
Hierarchical Test Generation And Design For Testability Of ASPPs and ASIPs
Author :
Ghosh, Indradeep ; Raghunathan, Anand ; Jha, Niraj K.
Author_Institution :
Princeton University, Princeton, NJ 08544
fYear :
1997
fDate :
9-13 June 1997
Firstpage :
534
Lastpage :
539
Keywords :
Application specific processors; Circuit faults; Circuit testing; Design for testability; Digital signal processing; Permission; Read-write memory; Registers; Sequential analysis; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
0-7803-4093-0
Type :
conf
DOI :
10.1109/DAC.1997.597205
Filename :
597205
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2572476
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