DocumentCode

2572853

Title

A Scheme For Integrated Controller-datapath Fault Testing

Author

Nourani, M. ; Carletta, J. ; Papachristou, C.

Author_Institution

University of Tehran Tehran, Iran

fYear

1997

fDate

9-13 June 1997

Firstpage

546

Lastpage

551

Keywords

Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Control systems; Data engineering; Logic; Permission; Semiconductor device testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1997. Proceedings of the 34th

Conference_Location

Anaheim, CA, USA

ISSN

0738-100X

Print_ISBN

0-7803-4093-0

Type

conf

DOI

10.1109/DAC.1997.597207

Filename

597207