Title :
A Scheme For Integrated Controller-datapath Fault Testing
Author :
Nourani, M. ; Carletta, J. ; Papachristou, C.
Author_Institution :
University of Tehran Tehran, Iran
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Control systems; Data engineering; Logic; Permission; Semiconductor device testing; System testing;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-4093-0
DOI :
10.1109/DAC.1997.597207
