• DocumentCode
    2572927
  • Title

    Condensation model of Vapour Phase Soldering

  • Author

    Illés, Balázs ; Géczy, Attila

  • Author_Institution
    Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2012
  • fDate
    25-28 Oct. 2012
  • Firstpage
    63
  • Lastpage
    68
  • Abstract
    This paper presents a modeling approach of vapour condensation during the Vapour Phase Soldering (VPS) process at board level. This model is based on a process (machine) level model which calculates the vapour and temperature space in the VPS tank. The board level condensation model is embedded into the process level model (presented in [1]). The condensation model applies combined transport mechanisms including heat transport by heat conduction; mass transport by phase change during the condensation of the Galden liquid; and energy transport caused by mass transport. The model uses a special dew point calculation which was defined for Galden liquid by experiments. The model can describe the temperature change of the soldered assembly and transmit data to the process level model. This way the effect of the soldered assembly on the vapour space can be investigated.
  • Keywords
    assembling; condensation; heat conduction; soldering; Galden liquid condensation; VPS process; VPS tank; board level condensation model; combined transport mechanisms; dew point calculation; heat conduction; heat transport; machine level model; mass transport; phase change; process level model; soldered assembly; vapour condensation modeling approach; vapour phase soldering; Liquids; Mathematical model; Soldering; Space heating; Temperature measurement; condensation; heating; vapour phase soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2012 IEEE 18th International Symposium for
  • Conference_Location
    Alba Iulia
  • Print_ISBN
    978-1-4673-4760-0
  • Electronic_ISBN
    INAVLID ISBN
  • Type

    conf

  • DOI
    10.1109/SIITME.2012.6384347
  • Filename
    6384347